LAGRAF, F.; DJAMIL , R.; GUERGOURI , K. Study of interface trapped charges effect on performance of junction less trial material cylindrical surrounding-gate MOSFETs. Journal of New Technology and Materials, [S. l.], v. 9, n. 01, p. 52–58, 2025. Disponível em: http://review.univ-oeb.dz/ojs.jntm/index.php/jntm/article/view/115. Acesso em: 5 feb. 2025.