Investigation and comparison of electrical and optical properties of RF sputtered Cu doped ZnO and ZnO/Cu/ZnO multilayer films

Authors

  • Sara Zaabat LCAM Laboratory, University Larbi Ben M’hidi, 0004, Oum El Bouaghi, Algeria. b LPL Laboratory, UMR 7538, University of Paris 13 Nord, France
  • Fatiha Challali LSPM Laboratory, Cnrs – UPR 3407, University of Paris 13 Nord, France
  • Mahmoud Chakaroun LPL Laboratory, UMR 7538, University of Paris 13 Nord, France
  • Boudine Boubaker Laboratory of Crystallography, University of Constantine 1, 25000 Constantine, Algeria
  • Azzedine Boudrioua LPL Laboratory, UMR 7538, University of Paris 13 Nord, France

Keywords:

ZnO:Cu ,, multilayers,, esistivity,, ransmittance,, sputtering

Abstract

This study presents the comparison of structural, electrical and optical properties of Cu doped ZnO films and
ZnO/Cu/ZnO multilayer films before and after annealing, they are produced via radio frequency magnetron
sputtering. the results showed that all films has a good crystalline properties after annealing, ZnO/Cu/ZnO
multilayer films showed low resistivity of 1.8 × 10 -3 Ω.cm and an average transmittance of 75%, these parameter
values indicate that films are a potential candidate for high-quality electrodes in various displays

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Published

2025-01-06

How to Cite

Zaabat , S., Challali , F., Chakaroun , M., Boubaker , B., & Boudrioua , A. (2025). Investigation and comparison of electrical and optical properties of RF sputtered Cu doped ZnO and ZnO/Cu/ZnO multilayer films. Journal of New Technology and Materials, 9(02), 45–50. Retrieved from http://review.univ-oeb.dz/ojs.jntm/index.php/jntm/article/view/133

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